T450 series specialized performance membrane thickness instrument is the exquisite quality of the instrument. It adopts micro-focused enhanced ray tube and digital multi-channel pulse signal processin
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在线咨询T450 series specialized performance membrane thickness instrument is the exquisite quality of the instrument. It adopts micro-focused enhanced ray tube and digital multi-channel pulse signal processing technology, and is equipped with enhanced FP algorithm software and zoom device, which is more accurate, stable and efficient when detecting various size plane, special-shaped parts, multi-layer alloy and electroplating liquid.
l Micrometer-level mobility accuracy | l Zoom and focus are integrated technology |
l No one-click test is required | l Large-area Si-pin semiconductor detector |
l Microfocused, high-integrated vertical optical path switching device | |
Instrument performance
Micrometer-level mobility accuracy | High-precision mobile platform, fast and accurate positioning of multi-point detection |
Microfocused, high-integrated vertical optical path switching device | The frontier optical path focusing system is designed to realize the efficient, accurate and stable detection of very small measurement points |
Zoom and focus are integrated technology | NDT of various shaped grooves, groove depth range up to 35mm |
Large-area Si-pin semiconductor detector | The industry chooses more high performance and high resolution detector, which can greatly improve the measurement accuracy and stability |
Low cost of use | Low operation and maintenance cost, no vulnerable consumables, and relatively low requirements for the use environment |
The service life is super long | Intelligent high pressure control with heat dissipation system, greatly improve the service life and stability of the instrument |
instrument parameter
model | T450 | T450S |
Coating layer analysis | Li(3)-U(92) | |
algorithm | Enhanced FP algorithm | |
Analysis software | 15 layers of plating and 24 elements can be analyzed simultaneously | |
Ray direction | From the bottom up | |
The X-ray generator device | Microfocused enhanced-ray tube | |
acceptor | Large-area si-pin semiconductor detector | SDD prober |
multi-channel analyzer | The DPP digital multichannel analysis technique | |
high-handed | A 0-50KV intelligent program-controlled high-voltage system | |
collimator | Standard Φ0.3mm(Φ0.3mm/Φ0.2mm/Φ0.5mm three) | |
Sample observation | Industrial CCD HD camera | |
enlargement factor | Optical magnification of 30 times | |
Spot diffusivity | <10% | |
zoom lens control device | Standard (measurable able able) | |
Mobile platform | Standard with the XY mobile platform | |
Appearance size | 555*573*573mm | |
The cavity size | 410*478*245mm | |
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